Volume 96, Issue 12 01 December 2025 | | |  |  | Advanced electron beam lithography strategies for fabrication of high-precision VLS x-ray gratings  Kevin Hofhuis,Nazanin Samadi,Bjarke A. Frederiksen,Konstantins Jefimovs,Analía F. Herrero,Tino Seliger,Frank Siewert,Bas Ketelaars,Christiaan Zonnevylle,Vitaliy A. Guzenko,Christian David READ MORE >
Invited Article: High-quality blazed gratings through synergy between e-beam lithography and robust characterization techniques  Analía F. Herrero,Nazanin Samadi,Andrey Sokolov,Grzegorz Gwalt,Stefan Rehbein,Anke Teichert,Bas Ketelaars,Christiaan Zonnevylle,Thomas Krist,Christian David,Frank Siewert READ MORE >
Advances of semiconductor gas sensor on multi-parameter sensing and features extraction methods Binqiang Ye,Minglang Zhang,Bin Jiang,Bingsheng Du,Bin Tang,Binbin Luo,Shenghui Shi,Zhourong Long,Jianxu Wang,Xiaolin Peng,Yong He READ MORE >
A multipurpose setup for ultrafast XUV spectroscopies Arun Ravindran,Filippo Bencivenga,Emanuele Coccia,Giovanni De Ninno,Laura Foglia,Riccardo Mincigrucci,Eleonora Luppi,Barbara Ressel,Maurizio Sacchi,Jurij Urbancic,Carlo Spezzani READ MORE >
Single-shot ultrabroadband coherent detection of high-energy THz pulses Alexander Holm Ohrt,Jieya Ruan,Long Cheng,Hongyuan Wu,Jie Ji,Xinyao Zhang,Ran Yan,Olivér Nagy,Jinguang Wang,Yifei Li,Xuan Wang,Xin Lu,Guoqian Liao,Yutong Li,Peter Uhd Jepsen,Binbin Zhou READ MORE >
Characterization of spatiotemporal overlap of femtosecond lasers and electron beam with Ce:YAG screens Kevin Eckrosh,Sean Tilton,Lucas Malin,Taryn Brown,Alan Dupre,Antonella Semaan,Alex Gardeck,Gregory Babic,Hyung Seo Lee,Henrik Loos,Mukhtar Hussain,Arvinder Sandhu,William S. Graves,Mark R. Holl,Samuel W. Teitelbaum READ MORE >
Simultaneous hard x-ray Talbot phase and dark-field imaging in laser experiments at XFEL facilities  V. Bouffetier,M. P. Valdivia,L. Ceurvorst,D. Stutman,G. Rigon,B. Albertazzi,M. Koenig,T. Pikuz,N. Ozaki,H. Nakamura,Y. Hironaka,K. Miyanishi,T. Yabuuchi,T. Togashi,K. Sueda,M. Yabashi,T. Goudal,D. Mancelli,A. Casner,G. Pérez-Callejo READ MORE >
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