Advances in Spectroscopic Ellipsometry Methods and Materials Characterization – Now Open for Submissions!

Submit to this Special Topic in AIP Advances, Applied Physics Letters, and Journal of Applied Physics View in Browser SUBMIT AN ARTICLE MANAGE MY ALERTS OUR JOURNALS Call for Papers Now Open for Submissions Joint Special Topic from AIP Advances, Applied Physics Letters, and Journal of Applied Physics: Advances in Spectroscopic Ellipsometry Methods and Materials Characterization The Special Topic seeks manuscript submissions covering a broad range of aspects in the field of ellipsometry and polarimetry, as well as related applications utilizing the polarization properties of light as a diagnostic of surfaces, interfaces, thin films, nanostructures, and bulk materials.  We seek manuscripts which report on newest advances in theory, instrumentation, and applications of spectroscopic ellipsometry and polarimetry across physics, chemistry, material science, and life sciences, as well as engineering and metrology. Topics covered include, but are not limited to: • Machine Learning/Artificial Intelligence • Advanced instrumentation and modeling • In-situ and real-time process control in thin film deposition techniques, specifically ALD, PLD, CVD etc. • Wideband gap and Ultrawideband gap semiconductors • Anisotropic materials • Organic materials and organic electronics • Semiconductor hetero- and device structures • Imaging instrumentation, approaches, and applications • Pump-probe fs/ps time-resolved ellipsometry • Terahertz instrumentations and applications • Industrial applications • Low-dimensional and topological materials • Extended ultraviolet instrumentation and applications • Biological materials and life science applications Guest Editors Mathias Schubert, University of Nebraska-Lincoln, USA and Lund University, Sweden David E. Aspnes, North Carolina State University, USA Alain Diebold, SUNY Albany, USA Ufuk Kilic, University of Nebraska-Lincoln This Special Topic collection is a joint initiative between Applied Physics Letters, Journal of Applied Physics, and AIP Advances, providing a unique opportunity to publish in the journal that best aligns with your research. Authors may submit to any of the three participating journals: Applied Physics Letters publishes short-format letters that emphasize rapid dissemination of novel data and physical insights. Authors can publish at no cost under a traditional license or choose Open Access for a fee of $3,800. Journal of Applied Physics features full-length articles that advance understanding in applied physics. Articles are published Open Access with no author fee, supported by the journal's Subscribe to Open model. AIP Advances is a fully Open Access, multidisciplinary journal covering all areas of the physical sciences. The Article Processing Charge is $1,800. If a manuscript is better suited to a different participating journal, the editorial team may recommend a transfer with the author's approval. Submission Deadline: November 30, 2025 SUBMIT TO APPLIED PHYSICS LETTERS > SUBMIT TO JOURNAL OF APPLIED PHYSICS > SUBMIT TO AIP ADVANCES > Tell Us What You Think! Did you like this email? Yes > No >  Follow us on social media   Copyright © 2025 AIP Publishing. All rights reserved. 1305 Walt Whitman Rd., Melville, NY 11747 You are receiving this email because you have opted-in to receive alerts from us. To guarantee delivery of this email please add journals@aip-info.org to your address book and safe senders list. If you no longer wish to receive emails from us then please unsubscribe or amend your settings. Privacy Policy